Internship / Master thesis on optical metasurface scatterometry metrology (m/f/x)

Beschreibung:

Your role

With us, you have the opportunity to perfectly combine your studies with practical experience while actively contributing to exciting projects. This allows you to gain valuable skills, expand your network, and grow both professionally and personally.
* Development and optimization of geometrical profile reconstruction of nanostructures
* Creation and consolidation of a full metrology software
* Integration within metasurfaces simulations
* Quantitative evaluation of metrology uncertainties and error propagation
* Comparison of optical metrology with other metrology techniques such as SEM, TEM for full validation
* Documentation of the algorithms developed and results

Your profile

* A background in Electromagnetism (Interferometry, scattering, ...) and optical Metrology and /or applied mathematics (optimization, statistics, inverse problem)
* You are enrolled in a Bachelor's or Master's program in one of the above subjects and experience in these fields and optical design is a plus
* Applied knowledge in Python and /or MATLAB

Sounds exciting? Then become part of #teamZEISS and help us shape the future! Please provide your complete application documents (CV, transcript of records, etc.).

Your ZEISS Recruiting Team:Franziska Gansloser