Master thesis: Plasma-induced damage reliability investigations (f/m/div)

Descripción del puesto:

As a global semiconductor leader in power systems and IoT, we enable game-changing solutions for green and efficient energy, clean and safe mobility, as well as smart and secure IoT. That's why you probably use our products every day: smartphone, charger, electric toothbrush, coffee machine, refrigerator, remote control and much more. Does that sound interesting to you? Then apply directly, we look forward to hearing from you!
Within your master thesis, you will introduce an advanced NBTI characterization method for plasma-induced damage-degraded pMOS transistors

* Experience research: You will use advanced reliability characterization techniques to experiment with various types of CMOS transistors
* Focus on the future: You will gain experience with cutting edge semiconductor methodology
* Take responsibility: You will use labwork and communication to drive a development project
* Shape the future: You will learn how to use new technology in an industrial environment

Requerimientos del candidato/a:

* Study field: You are currently studying for a master's degree in physics, electrical engineering, materials science or similar
* Experience: You have already gained some knowledge in the field of semiconductors, and you are motivated to learn about semiconductor reliability
* Personality: You like working in an international team and enjoy communicating with different stakeholders
* Way of working: You are characterized by a proactive and reliable approach to work
* IT- Skills: You are proficient in using MS Excel and ideally have some programming experience
* Language skills: You have fluent German and English skills, both written and spokenPlease attach the following documents to your application:

* CV in English
* Certificate of enrollment at university
* Excerpt of the study regulations for the thesis (if applicable)
* Latest grades transcript (not older than 6 months)
* High school report